Research Article Open Access

ED-XRF Analysis of Total Suspended Particulates from Enamelware Manufacturing Industry

J. A. Sonibare, F. A. Akeredolu, O. Osibanjo and I. Latinwo


Concentration and elemental composition of the total suspended particulates (TSP) emitted due to manufacturing activities of an enamelware industry in Lagos, Nigeria were investigated. Gravimetric method was used in mass concentration determination and an energy dispersive x-ray fluorescence (ED-XRF) analyzer was employed in the multi-elemental analysis. The Federal Ministry of Environment (FMENV, Nigeria's environment regulating body) set limit of 250 ug/m3 for ambient TSP was exceeded in five of the seven sampling locations within the company premise. The maximum concentration (about 8 fold of the limit) was recorded in the Decorating section and the minimum in Front of the Administrative Block (about 3 times less than set limit) that is an outdoor location. Elements detected from all the samples were Al, Si, P, K, Ca, Ti, Mn, Fe, Cu, Zn, Cd and Na. The work showed that installation of dust extractors, provision of spraying boot and proper training of factory workers in the handling of spraying guns are part of measures required for the control of total suspended particulates (TSP) emission in the enamelware manufacturing industry.

American Journal of Applied Sciences
Volume 2 No. 2, 2005, 573-578


Submitted On: 3 November 2005 Published On: 28 February 2005

How to Cite: Sonibare, J. A., Akeredolu, F. A., Osibanjo, O. & Latinwo, I. (2005). ED-XRF Analysis of Total Suspended Particulates from Enamelware Manufacturing Industry. American Journal of Applied Sciences, 2(2), 573-578.

  • 12 Citations



  • ED-XRF Analysis
  • TSP
  • Enamelware
  • Manufacturing Industry