Research Article Open Access

Static and Dynamic Location of Variable Impedance Devices for Stability Studies

N. Magaji1, M. W. Mustafa1, Ado Dan-Isa1 and A. U. Lawan2
  • 1 Department of Electrical Engineering, Faculty of Engineering, Bayero University, Kano, Nigeria
  • 2 Department of Power System, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, Malaysia


This study used the concept of model controllability and observability in product form called residue factor to find the best location of Thyristor-Controlled based series and shunt devices called variable impedance devices. The success of this controller depends on its best possible location in busbar or line of power system network. The method is based on the relationship between the parameters of variable impedance devices to the vital modes. Linearization of non linear model of Power system and the thyristors based FACTS devices provide mens of computing residue factor and singular value factor. The location of variable impedance or thyristors based controllers have been calculated for the base case only. The usefulness of the these methods of placement considered 16 machines, 68 bus systems.

American Journal of Applied Sciences
Volume 10 No. 5, 2013, 497-506


Submitted On: 15 March 2012 Published On: 31 May 2013

How to Cite: Magaji, N., Mustafa, M. W., Dan-Isa, A. & Lawan, A. U. (2013). Static and Dynamic Location of Variable Impedance Devices for Stability Studies. American Journal of Applied Sciences, 10(5), 497-506.

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  • Thyristor-Controlled Series Compensator (TCSC)
  • Static Var Compensator (SVC)
  • New England Test System (NETS)
  • New York Power System (NYPS)