Research Article Open Access

Single Stuck-At Fault Diagnosing Circuit of Reed-Muller Canonical Exclusive-Or Sum of Product Boolean Expressions

P. N. Neelakantan and A. E. Jeyakumar

Abstract

A testable design with a universal test set for single stuck-at zero and stuck-at one faults of Reed-Muller canonical form of Exclusive-OR sum of product logic expressions is proposed. The test circuit detects almost all the single stuck-at faults and needs only simple modifications for variations in the circuit under test. The number of test vectors is also quite small compared with the classical method. The factor of un-identifiability is discussed and a new quantification parameter for the fault diagnosis has also been introduced. Results of Matlab simulations for a few logic functions are included.

Journal of Computer Science
Volume 2 No. 7, 2006, 595-599

DOI: https://doi.org/10.3844/jcssp.2006.595.599

Submitted On: 19 February 2006 Published On: 31 July 2006

How to Cite: Neelakantan, P. N. & Jeyakumar, A. E. (2006). Single Stuck-At Fault Diagnosing Circuit of Reed-Muller Canonical Exclusive-Or Sum of Product Boolean Expressions . Journal of Computer Science, 2(7), 595-599. https://doi.org/10.3844/jcssp.2006.595.599

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Keywords

  • Combinational circuits
  • exclusive-or sum of products
  • Reed-Muller canonical form
  • single stuck-at faults
  • testability realization
  • universal test set