@article {10.3844/ajassp.2005.682.687,
article_type = {journal},
title = {Design of a Current Sensor for IDDQ Testing of CMOS IC},
author = {Ali, Mohd Liakot and Khamis, Nurul Huda},
volume = {2},
year = {2005},
month = {Mar},
pages = {682-687},
doi = {10.3844/ajassp.2005.682.687},
url = {https://thescipub.com/abstract/ajassp.2005.682.687},
abstract = {This study presents the design of an off-chip current sensor for IDDQ testing of CMOS
(Complementary Metal-oxide Semiconductor) ICs (integrated circuit). It provides a linear voltage
signal of IDDQ current with a conversion factor of 5 mV/μA without any amplification. A voltage-controlled
switch is used to bypass the transient current peaks. It has also been shown that the sensor is
capable of detecting IDDQ faults of a circuit at 100 kHz test frequency without degrading its
performance.},
journal = {American Journal of Applied Sciences},
publisher = {Science Publications}
}