TY  - JOUR
AU  - Ali, Mohd Liakot 
AU  - Khamis, Nurul Huda 
PY  - 2005
TI  - Design of a Current Sensor for IDDQ Testing of CMOS IC
JF  - American Journal of Applied Sciences
VL  - 2
IS  - 3
DO  - 10.3844/ajassp.2005.682.687
UR  - https://thescipub.com/abstract/ajassp.2005.682.687
AB  - This study presents the design of an off-chip current sensor for IDDQ testing of CMOS
(Complementary Metal-oxide Semiconductor) ICs (integrated circuit). It provides a linear voltage
signal of IDDQ current with a conversion factor of 5 mV/μA without any amplification. A voltage-controlled
switch is used to bypass the transient current peaks. It has also been shown that the sensor is
capable of detecting IDDQ faults of a circuit at 100 kHz test frequency without degrading its
performance.