TY  - JOUR
AU  - Ikhmayies, Shadia J. 
AU  - Ahmad-Bitar, Riyad N. 
PY  - 2008
TI  - Effect of Film thickness on the Electrical and Structural Properties of CdS: In Thin Films 
JF  - American Journal of Applied Sciences
VL  - 5
IS  - 9
DO  - 10.3844/ajassp.2008.1141.1143
UR  - https://thescipub.com/abstract/ajassp.2008.1141.1143
AB  - Polycrystalline CdS:In thin films were prepared by the Spray Pyrolysis (SP) technique on glass substrates at a substrate temperature Ts= 490°C. The effect of film thickness on the electrical and structural properties of the films was investigated through the analysis of the I-V plots, x-ray diffraction spectra (XRD) and the scanning electron microscope (SEM) images. The conductivity of the films was highly increased when the films became thicker. The crystal growth became stronger and more oriented as seen in the x-ray diffraction spectra and the grain size became larger as seen in the SEM images.