TY  - JOUR
AU  - Anomohanran, Ochuko 
PY  - 2013
TI  - Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum
JF  - American Journal of Applied Sciences
VL  - 10
IS  - 8
DO  - 10.3844/ajassp.2013.857.862
UR  - https://thescipub.com/abstract/ajassp.2013.857.862
AB  - The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.